Chung-Ho Chen This email address is being protected from spambots. You need JavaScript enabled to view it.1 and Min-Tsai Lai2 1Department of Industrial Management, Southern Taiwan University of Technology, Yung-Kang, Taiwan 710, R.O.C.
2Department of Business Adminstration, Southern Tainan University of Technology, Yung-Kang, Taiwan 710, R.O.C.
Received:
October 8, 2004
Accepted:
April 27, 2005
Publication Date:
June 1, 2006
Download Citation:
||https://doi.org/10.6180/jase.2006.9.2.09
In this paper, a simple method is developed to find the unique combination (i, f) that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the average fraction inspected (AFI) for a CSP-M plan with specified number of inspection levels when the process average p(> AOQL) is known.ABSTRACT
Keywords:
Multi-Level Continuous Sampling Plan (CSP-M Plan), Average Outgoing Quality (AOQ), Average Outgoing Quality Limit (AOQL), Average Fraction Inspected (AFI)
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