Comparison of SIRM and SOM on Microwave Imaging of the Rough Surface

Wei Chien; Chien-Ching  Chiu; Chang-En Wu

doi:10.6180/jase.201809_21(3).0002

Comparison of SIRM and SOM on Microwave Imaging of the Rough Surface

Wei Chien¹, Chien-Ching Chiu This email address is being protected from spambots. You need JavaScript enabled to view it.² and Chang-En Wu²

¹Department of School of Electric and Information Engineering, Qinzhou University, Guangxi Province, 535000, P.R. China
²Electrical Engineering Department, Tamkang University, Tamsui, Taiwan 251, R.O.C.

Received: November 14, 2017
Accepted: April 16, 2018
Publication Date: September 1, 2018

Download Citation: ||https://doi.org/10.6180/jase.201809_21(3).0002

ABSTRACT

In this paper, the source inversion related method (SIRM) and subspace-based optimization method (SOM) to reconstruct the shape and dielectric constant of the rough surface are investigated. The reconstruction of rough surface has been achieved by buried object approach (BOA), which considers the roughness as a series of objects located alternately on both sides of a planar interface between two half space. By calculating the dielectric constant of these buried objects, we can reconstruct the shape of rough surface through the application of the integral equations and the measured scattered field. The inverse scattering problem is transformed into an optimization problem by SIRM and SOM techniques respectively and solved by self-adaptive dynamic differential evolution (SADDE). Simulation results show that both SIRM and SOM methods can get good results by SADDE algorithms. Simulation results also show that the convergence for SOM is better than that for SIRM.

Keywords: Rough Surface, Self-adaptive Dynamic Differential Evolution (SADDE), Subspace-based Algorithm

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