Journal of Applied Science and Engineering

Published by Tamkang University Press

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Analysis of Circuit Noise in Integral Electronics Piezoelectric Accelerometer

 2015

 Volume 18, Issue 3

Yutian Wang, Zhe Yang, Pengfei Cheng and Hongjin Li

Shool of Electrical Engineering, Yanshan University, Qinhuangdao, Hebei Province 066004, P.R. China

Received: March 18, 2015
Accepted: July 20, 2015
Publication Date: August 22, 2026

上傳圖片

The schematic of IEPE accelerometer.

 Copyright The Author(s). This is an open access article distributed under the terms of the Creative Commons Attribution License (CC BY 4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are cited.

Download Citation:  BibTeX | http://dx.doi.org/10.6180/jase.2015.18.3.10  

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Integral electronics piezoelectric (IEPE) accelerometers are the vibration acceleration sensors using piezoelectric effect. Analyze the main noise sources of IEPE accelerometer circuit. With the noise model of En – In the internal noise is equivalent to input, realizing the direct comparison of the input noise and signal, and easily getting the noise effect on the signal. Propose the transformation principle of Y – Δ to the T network noise analysis to reduce the difficulty of the noise analysis. Deduce the formula of the circuit background noise in IEPE accelerometer in the broadband. The comparison of noise analysis values of theoretical and obtained by PSpice software proves a good correlation and shows the correctness and effectiveness of the formulas. Meanwhile, put forward the methods of total noise reduction in different frequencies based on the deduced noise formula of the contributions of various noise sources at the input to the total noise. The studies provide a theoretical basis for IEPE accelerometer circuit design in low noise, parameter selection and performance optimization.

Keywords: IEPE, Vibration Acceleration Sensor, Circuit Noise, Broadband

  1. [1] Craig, Ar., Sensor Technology Handbook., pp. 137-159 (2005).
  2. [2] Sharapov, V., Piezoceramic Sensors. Berlin: Springer Berlin Heidelberg, pp. 381-408 (2011).
  3. [3] Schloss, F., “Accelerometer Noise,” Sound and Vibration, Vol. 27, pp. 22-23 (1993).
  4. [4] Levinzon, F. A., “Noise of Piezoelectric Accelerometer with Integral FET Amplifier,” IEEE Sensors Journal, Vol. 5, No. 6, pp. 1235-1242 (2005). doi: 10.1109/JSEN.2005.859256
  5. [5] Assaf, J., “Extraction of Noise Spectral Densities (Intrinsic and Irradiation Contributions) of a Charge Preamplifier Based on JFET,” Microelectronics Reliability, Vol. 53, No. 5, pp. 712-717 (2013). doi: 10.1016/j.microrel.2013.01.012
  6. [6] Yoo, S. W., Joonha, S., Seo, Y., et al., “Characterizing Traps Causing Random Telegraph Noise during Trap-assisted Tunneling Gate-induced Drain Leakage,” Solid-State Electronics., Vol. 109, pp. 42-44 (2015). doi: 10.1016/j.sse.2015.03.007
  7. [7] Venturini, M. and Zholents, A., “Modeling Microbunching from Shot Noise Using Vlasov Solvers,” Nucl Instrum Meth A., Vol. 593, No. 1, pp. 53-56 (2008). doi: 10.1016/j.nima.2008.04.036
  8. [8] Chen, W. H., Low Noise Test Technology and Application Research of Electronic Components, PhD. Dissertation. Xidian University, Xi’an, China (2012).
  9. [9] Gray, P. R., Hurst, P. J., Meyer, R. G., et al., Analysis and Design of Analog Integrated Circuits, New York: John Wiley & Sons, Inc., pp. 768-769 (2008).