1Department of Industrial Management Southern Taiwan University of Technology Yungkang, Taiwan 710, R.O.C.
Received:
April 21, 2003
Accepted:
October 7, 2003
Publication Date:
March 1, 2004
Download Citation:
||https://doi.org/10.6180/jase.2004.7.1.06
ABSTRACT
In 2000, Balamurali and Govindaraju presented the modified tightened two-level continuous sampling plan (modified MLP-T-2 plan). This paper explores the problem of minimizing the average fraction inspected (AFI) for a modified MLP-T-2 plan. The solution procedure is developed to find the optimal parameters that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the AFI for the modified MLP-T-2 plan when the process average p (>AOQL) is known.
Keywords:
Type I Continuous Sampling Plan, Modified Tightened Two-level Continuous Sampling Plan, Average Outgoing Quality, Average Outgoing Quality Limit, Average Fraction Inspected
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