Minimum Average Fraction Inspected for Modified Tightened Two-level Continuous Sampling Plans

Chung-Ho Chen

doi:10.6180/jase.2004.7.1.06

Minimum Average Fraction Inspected for Modified Tightened Two-level Continuous Sampling Plans

Mathematics / Statistics

Chung-Ho Chen ¹

¹Department of Industrial Management Southern Taiwan University of Technology Yungkang, Taiwan 710, R.O.C.

Received: April 21, 2003
Accepted: October 7, 2003
Publication Date: March 1, 2004

Download Citation: ||https://doi.org/10.6180/jase.2004.7.1.06

ABSTRACT

In 2000, Balamurali and Govindaraju presented the modified tightened two-level continuous sampling plan (modified MLP-T-2 plan). This paper explores the problem of minimizing the average fraction inspected (AFI) for a modified MLP-T-2 plan. The solution procedure is developed to find the optimal parameters that will meet the average outgoing quality limit (AOQL) requirement, while also minimizing the AFI for the modified MLP-T-2 plan when the process average p (>AOQL) is known.

Keywords: Type I Continuous Sampling Plan, Modified Tightened Two-level Continuous Sampling Plan, Average Outgoing Quality, Average Outgoing Quality Limit, Average Fraction Inspected

REFERENCES

[1] Dodge, H. F., "A Sampling Inspection Plan for Continuous Production," Annals of Mathematical Statistics, Vol. 14, pp. 264−279 (1943).
[2] Dodge, H. F. and Torrey, M. N., "Additional Continuous Sampling Inspection Plans," Industrial Quality Control, Vol. 7, pp. 7−12 (1951).
[3] Lieberman, G. J. and Solomon, H., “Multi-level Continuous Sampling Plans,” Annals of Mathematical Statistics, Vol. 26, pp. 686−704 (1955).
[4] Derman, C., Littauer, S. and Solomon, H., “Tightened Multi-level Continuous Sampling Plans,” Annals of Mathematical Statistics, Vol. 28, pp. 395−404 (1957)
[5] Kandaswamy, C. and Govindaraju, K., “Selection of Tightened Two-level Continuous Sampling Plans,” Journal of Applied Statistics, Vol. 20, pp. 271−284 (1993).
[6] Govindaraju K. and Balamurali S., “Tightened Single-level Continuous Sampling Plan,” Journal of Applied Statistics, Vol . 25, pp. 451−461 (1998).
[7] Balamurali, S. and Kalyanasundaram, M., “Generalized Tightened Two-level Continuous Sampling Plans,” Journal of Applied Statistics, Vol. 27, pp. 23−38 (2000).
[8] Balamurali, S. and Govindaraju, K., “Modified Tightened Two-level Continuous Sampling Plans,” Journal of Applied Statistics, Vol. 27, pp. 397−409 (2000).
[9] Ghosh, D. T., “The Continuous Sampling Plan that Minimises the Amount of Inspection,” Sankhy a , series B, Vol. 50, pp. 412−427 (1988).
[10] Resnikoff, G. J., “Minimum Average Fraction Inspected for a Continuous Sampling Plan,” Journal of Industrial Engineering, Vol. 11, pp. 208−209 (1960).
[11] Chen, C.-H., Cheng, T.-S. and Chou, C.-Y., “Minimum Average Fraction Inspected for TCSP-1 Plan,” Journal of Applied Statistics, Vol. 28, pp. 793−799 (2001).
[12] Montgomery, D. C., Introduction to Statistical Quality Control, 2nd edition, John Wiley & Sons, NY, U.S.A. (1991).